Sachdev, Manoj
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Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)
Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing Book 10)
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
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